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Inami, Toshiya; Owada, Kenji; Matsuda, Yasuhiro*; Ouyang, Z. W.*; Nojiri, Hiroyuki*; Matsumura, Takeshi*; Okuyama, Daisuke*; Murakami, Yoichi*
Journal of Physics; Conference Series, 211, p.012010_1 - 012010_6, 2010/02
Times Cited Count:3 Percentile:75.75(Physics, Applied)Terada, Noriki*; Nakajima, Taro*; Mitsuda, Setsuo*; Matsuda, Masaaki; Kakurai, Kazuhisa; Tanaka, Yoshihito*; Kitazawa, Hideaki*
Journal of Physics; Conference Series, 211(1), p.012005_1 - 012005_6, 2010/01
Times Cited Count:2 Percentile:66.79(Physics, Applied)Takeda, Masayasu; Yamazaki, Dai; Hirano, Tatsumi*
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The characterization of the magnetic interface structure in magnetic multilayers of a read sensor head is indispensable for producing the high-performance and high-reliability read sensor heads, because the device properties strongly depend on the structure. X-ray and neutron reflectometry is a powerful and nondestructive technique to investigate the internal layered structures. In this presentation, it is reported that several results of measurements of the magnetic multilayers for the read sensor heads using a conventional X-ray reflectometer in a laboratory and a new neutron reflectometer, SUIREN, installed at the C2-2 cold neutron beam port of the neutron guide hall in the research reactor, JRR-3, of Japan Atomic Energy Agency.